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Latest news
28/05/2009
Metris XT H 450 LC high-power micro-focus computed tomography system brings crystal clear inspection of turbine blades and dense parts
19/05/2009
Metris rotating reflection target sets new productivity and performance standards for industrial CT
14/05/2009
Camio 6.1 speeds up measurement preparation for ready-to-run inspection on any CMM
Upcoming events
July 14-16, 2009
Semicon West 2009
San Francisco, CA, USA
Jul 20-24
CMSC - Coordinate Metrology Systems Conference
Louisville, KY, US
Sept 22-24, 2009
Quality Expo 2009
Rosemont, IL, USA
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