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Products > CMM scanners > LC15

LC15
High resolution digitizing - An eye for detail

In today’s inspection processes there is the ever-increasing demand for inspecting more -and often smaller- objects with higher accuracies.
Due to the smaller field of view, the LC15 guarantees the accuracy and point density needed for small and detailed parts with tight tolerances.

Key features

  • High resolution & accuracy laser stripe scanner
  • Cutting edge compact & lightweight design
  • Fully compatible with Renishaw PH10
  • Automated qualification of the PH10 orientations
  • Compatibility with ACR-3 auto-exchange rack for easy tool exchange
  • Easy macro based path programming
  • Available for integration in native CMM software applications

Key benefits

  • Enables high resolution scanning of small or detailed objects requiring high point density
  • Enables accurate scanning of small parts with tight tolerances
  • Automatic scanning for repetitive measurement cycles
  • Seamless integration with most leading CMM manufacturers

Applications

  • Inspection of small & detailed objects such as mobile phones, turbine blades
  • Reverse engineering with specific needs for highest accuracy

Experience

Metris is the market leader in CMM based laser scanning and offers more than 10 years of experience in developing and producing laser scanners. Our focus lies on accuracy, productivity and CMM integration. We offer the widest range of integration options and solutions on the market and can mount our scanners onto virtually any type of CMM including such brand names as Mitutoyo, Brown and Sharpe, DEA, Zeiss, Wenzel, Mora and Dukin. We also support integration on controllers by Renishaw and Metrolog.

 Phone scanning

Tubine blade inspection

Specifications

Weight 302g
Dimensions 103x99x63mm
Scan speed 19200 real1 pts/s
Width of view 15mm
Depth of view 15mm
Accuracy2  8µm (1σ sphere fit)
Stand off distance 65mm
Laser Class 2
1 Metris points-per-second and points-per-line specifications state real scan points only. No interpolation techniques are used to oversample the point clouds!
2 Depending on CMM & according to Metris acceptance procedure
All specifications are subject to change without notice.

Case studies


Balda AG performs 3D laser inspection of mobile phones


Product brochures

LC15 - High accuracy scanning

Metris CMM scanning solutions


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